Workflow
① Place the label chip position to the center position that the microscope can see;
② Toggle the label clamping switch to clamp the label;
③ Turn on the label vacuum adsorption switch;
④ Adjust the left, right and height position of the push knife, preferably directly behind the chip;
⑤ It is better to move the push knife to the position near the chip by jog, and the height of the push knife and the chip height can be clearly seen;
⑥ Press the one-key test button to perform thrust test, and then write down the maximum thrust value;
⑦ Press the push knife reset button to reset the push knife;
Feature
1. By use of Zoom-stereo microscope from 7 to 45 in amplification range;
2. Special push-type broach design is more available in RFID using;
3. High standard push-pull tester to ensure the range to 5kgf;
4. Automatic clamping for labels and support vacuum adsorption function;
5. Position of push-type broach is available for micro-adjustment of L/R, H/L;
6. Controlled by PLC+ Touch Screen, the broach supports adjustment for rate/route of travel;
7. Good appearance and durable for using in long time.
The WT-007RPST RFID Chip Peel Strength Tester not require manual operation to mobilize the push knife. At the same time, it also greatly improves the efficiency of clamping the electronic label. It only needs a switch to realize the clamping of the electronic label, which is convenient for customers. Stability, the need for multi-batch thrust testing.
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